POWER ELECTRONICS · PILOT PROPOSAL

A focused GaN / SiC component-review pilot.

A proposed, scoped review of selected component references and source changes for engineering teams working on power conversion.

Current product: a manual private source watchlist. The pilot offer below is proposed and subject to scoping.

PROPOSED PILOT · SUBJECT TO SCOPING

USD $15,000

Proposed fee for the scoped 60-day pilot

Term
60 days
References
Up to 100 selected GaN / SiC parts
Review rhythm
Weekly CSV updates + one weekly engineering review

Availability, final scope, and fee require scoping and written agreement.

WHY THESE DEVICES

Different materials, distinct reliability questions.

The technical case is about understanding the component and its source context—not watching a device operate in the field.

01 / GaN HEMTs

Transient overvoltage and trapping

A study of p-gate GaN HEMTs reports failure at a transient peak resonant voltage, with the limit tied to device overvoltage capability and electric-field stress rather than total surge energy or its duration. Charge trapping can also shift dynamic on-resistance, commonly discussed as current collapse.

02 / SiC MOSFETs

Gate-oxide aging

SiC reliability work examines gate-dielectric lifetime, time-dependent dielectric breakdown, bias-temperature instability, and gate-switching instability. These are qualification and aging concerns that depend on device and application context.

APPLICATION CONTEXT

Wide-bandgap devices are used in EV electric-drive conversion and traction inverters, as well as solar PV inverter designs. Those applications make component selection and source changes relevant engineering questions; they do not establish public field failures caused by GaN / SiC substitution.

WHAT IS AVAILABLE

A clear line between today and the proposal.

AVAILABLE TODAY

Manual private watchlists

Scalus’s current product lets an account holder keep a private source watchlist, capture source snapshots manually, receive a private change alert when a capture differs from the preceding snapshot, and keep notice links and snapshot history. Create a free account to use the existing watchlist.

Open the free watchlist

PROPOSED FOR THIS PILOT

Scoped source-change review

The proposed work is a review of selected GaN / SiC component references and relevant source changes, with weekly CSV updates and a weekly engineering review. It is not live device monitoring. Impact reviews and alternative-part recommendations remain planned capabilities.

NOT ESTABLISHED

Buyer demand and incident precedent

The supplied research supports device reliability mechanisms and application fit, but does not establish willingness to pay. It found no public case linking an unnoticed GaN / SiC substitution to a field failure.

PROPOSED PAID PILOT

A bounded first engagement to scope together.

This is a proposal to discuss, with pricing, service, and findings all subject to scoping. Final scope, availability, and fee depend on written agreement.

No guarantee is made about coverage, accuracy, latency, results, or service levels.

PROPOSED TERMS · SUBJECT TO SCOPING

Term
60 days
Selected references
Up to 100 GaN / SiC component references
Updates
Weekly CSV updates
Engineering time
One weekly engineering review
Proposed fee
USD $15,000
Ask about the proposed scope

PILOT INTEREST

Tell us what your team needs to review.

Share your engineering use case. An inquiry is not a commitment and does not reserve a place in a pilot.

Submitting an inquiry does not reserve a pilot or confirm pricing or availability.

Research links

These publications support the technical mechanism and application statements above. They do not validate buyer willingness to pay or establish substitution-linked field incidents.

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    A Status Overview of SiC MOSFET Reliability 2024 IEEE International Electron Devices Meeting
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