Current product: a manual private source watchlist. The pilot offer below is proposed and subject to scoping.
PROPOSED PILOT · SUBJECT TO SCOPING
USD $15,000
Proposed fee for the scoped 60-day pilot
Term
60 days
References
Up to 100 selected GaN / SiC parts
Review rhythm
Weekly CSV updates + one weekly engineering review
Availability, final scope, and fee require scoping and written agreement.
WHY THESE DEVICES
Different materials, distinct reliability questions.
The technical case is about understanding the component and its source context—not watching a device operate in the field.
01 / GaN HEMTs
Transient overvoltage and trapping
A study of p-gate GaN HEMTs reports failure at a transient peak resonant voltage, with the limit tied to device overvoltage capability and electric-field stress rather than total surge energy or its duration. Charge trapping can also shift dynamic on-resistance, commonly discussed as current collapse.
SiC reliability work examines gate-dielectric lifetime, time-dependent dielectric breakdown, bias-temperature instability, and gate-switching instability. These are qualification and aging concerns that depend on device and application context.
Wide-bandgap devices are used in EV electric-drive conversion and traction inverters, as well as solar PV inverter designs. Those applications make component selection and source changes relevant engineering questions; they do not establish public field failures caused by GaN / SiC substitution.
Scalus’s current product lets an account holder keep a private source watchlist, capture source snapshots manually, receive a private change alert when a capture differs from the preceding snapshot, and keep notice links and snapshot history. Create a free account to use the existing watchlist.
The proposed work is a review of selected GaN / SiC component references and relevant source changes, with weekly CSV updates and a weekly engineering review. It is not live device monitoring. Impact reviews and alternative-part recommendations remain planned capabilities.
NOT ESTABLISHED
Buyer demand and incident precedent
The supplied research supports device reliability mechanisms and application fit, but does not establish willingness to pay. It found no public case linking an unnoticed GaN / SiC substitution to a field failure.
PROPOSED PAID PILOT
A bounded first engagement to scope together.
This is a proposal to discuss, with pricing, service, and findings all subject to scoping. Final scope, availability, and fee depend on written agreement.
No guarantee is made about coverage, accuracy, latency, results, or service levels.
Share your engineering use case. An inquiry is not a commitment and does not reserve a place in a pilot.
Research links
These publications support the technical mechanism and application statements above. They do not validate buyer willingness to pay or establish substitution-linked field incidents.